Characterization of bread wheat germplasm for yield traits
Paper Details
Characterization of bread wheat germplasm for yield traits
Abstract
High yield in wheat is determined by various yield parameters including number of spikelet per spike, 1000-kernal weight, etc. Thus development of wheat plant containing all the best yield determining parameters in one variety is the ultimate goal of a successful breeding program. This study is aimed at exploring the wheat germplasm to identify wheat genotypes with better yield and yield components contributing towards higher wheat production. A total of 96 diverse wheat genotypes were studied for their morphological parameters which are contributing towards final yield. Genotypes varied in 1000-kernel weight (20.89 to 53 gm), days to flowering (96.33 to 107.50 days) and number of spikelets per spike (7.37 to 23429 spikelets per spike). Analysis of variance exhibited significant differences among mean values of the traits. Least significant difference test showed substantial genetic difference among the 96 genotypes. The present findings suggest that the genotypes investigated have the potential for using in future wheat improvement programs as well as can also be re-sequenced for identifying some novel SNPs which can pave the way for identifying genes and also designing new DNA markers for initiating breeding by design.
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