Quality and yield of snap bean lines locally developed in Kenya
Paper Details
Quality and yield of snap bean lines locally developed in Kenya
Abstract
Snap bean varieties with high yields of extra fine and fine yield are preferred to avoid heavy postharvest losses and reduced consumer appeal. The objective of this study was to select snap bean populations and lines developed for multiple disease resistance for high pod quality and yield. Six groups of snap beans populations at different generations and 49 snap bean lines including local checks were evaluated for their yield performance at KARI-Thika and Mwea for two seasons. Data collected included duration to flowering and maturity, pod length and width, number of pods per plant, marketable pod yield and pod quality (extra fine, fine and bobby). There were significant differences among the genotypes with respect to days to flowering, days to maturity, pod length, pod diameter, marketable pod yield and pod quality. Climbing snap bean took the longest duration to flower and mature compared to bush snap beans. Snap bean populations and lines with higher number of pods per plant, pod length and pod diameter than the local checks were recorded. Climbing lines had a highest pod diameter of 11mm among the snap bean lines. HAB 423 had the highest pod yield of 15.1 t/ha while Star 2053 was the best yielding parent check with pod yield of 11.5 t/ha. Star 2053 had the highest proportion of extra fine pod yield (92.6%) while SB-08-3-2 population had the highest proportion (85.8%) among the populations and lines. Therefore, it is evident that locally develop snap bean varieties with multiple disease resistance and high yields of acceptable quality can be achieved.
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